DocumentCode
3003485
Title
Numerical parasitic reactances at the interface between FDTD mesh and lumped elements
Author
Borzetta, L. ; Alimenti, F. ; Ciampolini, P. ; Mezzanotte, P. ; Roselli, L. ; Sorrentino, R.
Author_Institution
Dipt. di Ingegneria Elettronica e dell´Inf., Perugia Univ., Italy
Volume
4
fYear
1999
fDate
13-19 June 1999
Firstpage
1585
Abstract
This contribution focuses on the accuracy degradation arising at the interface between lumped element (LE) models and FDTD algorithm. The presence of numerical parasitic reactances has been already noticed in the past. Here these reactances have been estimated and numerical experiments have been given to prove the validity of the estimation provided.
Keywords
circuit simulation; electric reactance; equivalent circuits; finite difference time-domain analysis; lumped parameter networks; parallel plate waveguides; waveguide theory; FDTD mesh; accuracy degradation; estimation; interface; lumped elements; numerical parasitic reactances; Analytical models; Circuits; Degradation; Electromagnetic analysis; Equations; Finite difference methods; Helium; Inductance; Parasitic capacitance; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-5135-5
Type
conf
DOI
10.1109/MWSYM.1999.780261
Filename
780261
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