• DocumentCode
    3003547
  • Title

    Generation of test programs for the assertion-based verification of TLM models

  • Author

    Ferro, Luca ; Pierre, Laurence ; Ledru, Yves ; Du Bousquet, Lydie

  • Author_Institution
    TIMA (CNRS-INPG-UJF), Grenoble
  • fYear
    2008
  • fDate
    20-22 Dec. 2008
  • Firstpage
    237
  • Lastpage
    242
  • Abstract
    The context of this paper is the dynamic ABV (assertion-based verification) of TLM (Transaction Level Modeling) SystemC specifications, which characterize SoCs at a very high level of abstraction. We use a framework for supervising during the SystemC simulation the verification of temporal properties expressed in the PSL language. The efficiency of this approach can be improved by the selection of well-chosen stimuli that enable the analysis of a range of nominal behaviors as well as of corner cases. To that goal, the simulation/monitoring environment is coupled with the combinatorial testing tool Tobias that builds on the experience of the test engineer captured in test patterns to define sets of interesting test cases.
  • Keywords
    circuit simulation; combinatorial mathematics; integrated circuit testing; system-on-chip; PSL language; SoC; TLM models; assertion-based verification; combinatorial testing tool Tobias; dynamic ABV; monitoring environment; simulation environment; temporal properties; test programs; transaction level modeling SystemC specifications; Automatic test pattern generation; Automatic testing; Character generation; Computerized monitoring; Context modeling; Logic design; Specification languages; System testing; System-on-a-chip; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop, 2008. IDT 2008. 3rd International
  • Conference_Location
    Monastir
  • Print_ISBN
    978-1-4244-3479-4
  • Electronic_ISBN
    978-1-4244-3478-7
  • Type

    conf

  • DOI
    10.1109/IDT.2008.4802505
  • Filename
    4802505