DocumentCode :
3003547
Title :
Generation of test programs for the assertion-based verification of TLM models
Author :
Ferro, Luca ; Pierre, Laurence ; Ledru, Yves ; Du Bousquet, Lydie
Author_Institution :
TIMA (CNRS-INPG-UJF), Grenoble
fYear :
2008
fDate :
20-22 Dec. 2008
Firstpage :
237
Lastpage :
242
Abstract :
The context of this paper is the dynamic ABV (assertion-based verification) of TLM (Transaction Level Modeling) SystemC specifications, which characterize SoCs at a very high level of abstraction. We use a framework for supervising during the SystemC simulation the verification of temporal properties expressed in the PSL language. The efficiency of this approach can be improved by the selection of well-chosen stimuli that enable the analysis of a range of nominal behaviors as well as of corner cases. To that goal, the simulation/monitoring environment is coupled with the combinatorial testing tool Tobias that builds on the experience of the test engineer captured in test patterns to define sets of interesting test cases.
Keywords :
circuit simulation; combinatorial mathematics; integrated circuit testing; system-on-chip; PSL language; SoC; TLM models; assertion-based verification; combinatorial testing tool Tobias; dynamic ABV; monitoring environment; simulation environment; temporal properties; test programs; transaction level modeling SystemC specifications; Automatic test pattern generation; Automatic testing; Character generation; Computerized monitoring; Context modeling; Logic design; Specification languages; System testing; System-on-a-chip; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Test Workshop, 2008. IDT 2008. 3rd International
Conference_Location :
Monastir
Print_ISBN :
978-1-4244-3479-4
Electronic_ISBN :
978-1-4244-3478-7
Type :
conf
DOI :
10.1109/IDT.2008.4802505
Filename :
4802505
Link To Document :
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