• DocumentCode
    3003653
  • Title

    Recovering specular surfaces using curved line images

  • Author

    Yuanyuan Ding ; Jingyi Yu ; Sturm, Peter

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Univ. of Delaware, Newark, DE, USA
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    2326
  • Lastpage
    2333
  • Abstract
    We present a new shape-from-distortion framework for recovering specular (reflective/refractive) surfaces. While most existing approaches rely on accurate correspondences between 2D pixels and 3D points, we focus on analyzing the curved images of 3D lines which we call curved line images or CLIs. Our approach models CLIs of local reflections or refractions using the recently proposed general linear cameras (GLCs). We first characterize all possible CLIs in a GLC. We show that a 3D line will appear as a conic in any GLC. For a fixed GLC, the conic type is invariant to the position and orientation of the line and is determined by the GLC parameters. Furthermore, CLIs under single reflection/refraction can only be lines or hyperbolas. Based on our new theory, we develop efficient algorithms to use multiple CLIs to recover the GLC camera parameters. We then apply the curvature-GLC theory to derive the Gaussian and mean curvatures from the GLC intrinsics. This leads to a complete distortion-based reconstruction framework. Unlike conventional correspondence-based approaches that are sensitive to image distortions, our approach benefits from the CLI distortions. Finally, we demonstrate applying our framework for recovering curvature fields on both synthetic and real specular surfaces.
  • Keywords
    Gaussian processes; computational geometry; computer vision; image reconstruction; Gaussian curvature; curvature-GLC theory; curved line image; distortion-based reconstruction framework; general linear camera; shape-from-distortion framework; specular surface; Cameras; Geometry; Image reconstruction; Nonlinear distortion; Optical distortion; Optical reflection; Optical refraction; Robustness; Surface reconstruction; Utility programs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206624
  • Filename
    5206624