• DocumentCode
    3003664
  • Title

    An optimization approach for safety instrumented system design

  • Author

    Machleidt, Konstantin ; Litz, Lothar

  • Author_Institution
    Inst. of Autom. Control, Univ. of Kaiserslautern, Kaiserslautern, Germany
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    An optimization approach for Safety Instrumented System (SI S) design minimizing structure-dependant Life-Cycle Costs (LCC) is presented in this paper. It provides a systematic procedure to determine the most cost efficient SIS configuration for an equal degree of functional safety. The approach determines the optimal SIS architectures for sensor and final element subsystems, the optimal component sets (including heterogeneous redundancies), and the optimal distribution of Probability of Failure on Demand (PFD) among the subsystems. Downtime costs caused by proof tests and spurious trips of SIS are considered. The introduced optimization approach is applied to a practical case study. SIS design optimization is performed for a given PFD to a number of SIS components with different parameters. With regard to incurred LCC a large difference between analyzed SIS configurations is observed. Additionally, it is demonstrated that low total purchase costs of SIS components can lead to high LCC. The presented method is effective to reduce LCC by optimal SIS design.
  • Keywords
    design; failure (mechanical); finite element analysis; instrumentation; life cycle costing; probability; safety systems; structural engineering; SIS configuration; SIS design optimization; final element subsystem; optimal SIS architecture; optimal component; optimal distribution; probability of failure on demand; proof testing; safety instrumented system design; structure dependant life cycle costs minimization; Biological system modeling; Economics; Instruments; Iron; Optimization; Phase frequency detector; Safety; Costs; Optimization; Safety Instrumented Level; Safety Instrumented System; Spurious Trip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754503
  • Filename
    5754503