• DocumentCode
    3003771
  • Title

    Single-grain TFTs on location-controlled crystal grains formed by excimer laser crystallization of Si thin films

  • Author

    Kumomi, Hideya ; Shin, Chihiro ; Nakagawa, Gou ; Asano, Tanemasa

  • Author_Institution
    Leading-Edge Technol. Headquaters, Canon Inc., Kanagawa, Japan
  • fYear
    2004
  • fDate
    13-15 Dec. 2004
  • Firstpage
    773
  • Lastpage
    776
  • Abstract
    Single-grain Si thin-film transistors with no grain boundary in the channel are fabricated on location-controlled crystal grains formed by excimer-laser crystallization of Si thin films. Both of the n-channel and p-channel single-grain TFTs exhibit superior performance and single-crystal-like characteristics, compared to those over conventional random poly-Si TFTs fabricated by solid-phase crystallization or melting-crystallization on the same substrate, and by the same device process and configuration.
  • Keywords
    crystal growth; crystallisation; elemental semiconductors; excimer lasers; grain boundaries; semiconductor device manufacture; silicon; thin film transistors; Si; Si thin films; excimer laser crystallization; grain boundary; location-controlled crystal grains; melting-crystallization; n-channel single-grain TFT; p-channel single-grain TFT; random poly-Si TFT; semiconductor device configuration; semiconductor device processing; single-crystal-like characteristics; solid-phase crystallization; thin-film transistors; Acceleration; Crystallization; Grain boundaries; Microelectronics; Semiconductor thin films; Solid lasers; Sputtering; Substrates; Surface emitting lasers; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
  • Print_ISBN
    0-7803-8684-1
  • Type

    conf

  • DOI
    10.1109/IEDM.2004.1419288
  • Filename
    1419288