DocumentCode :
3003771
Title :
Single-grain TFTs on location-controlled crystal grains formed by excimer laser crystallization of Si thin films
Author :
Kumomi, Hideya ; Shin, Chihiro ; Nakagawa, Gou ; Asano, Tanemasa
Author_Institution :
Leading-Edge Technol. Headquaters, Canon Inc., Kanagawa, Japan
fYear :
2004
fDate :
13-15 Dec. 2004
Firstpage :
773
Lastpage :
776
Abstract :
Single-grain Si thin-film transistors with no grain boundary in the channel are fabricated on location-controlled crystal grains formed by excimer-laser crystallization of Si thin films. Both of the n-channel and p-channel single-grain TFTs exhibit superior performance and single-crystal-like characteristics, compared to those over conventional random poly-Si TFTs fabricated by solid-phase crystallization or melting-crystallization on the same substrate, and by the same device process and configuration.
Keywords :
crystal growth; crystallisation; elemental semiconductors; excimer lasers; grain boundaries; semiconductor device manufacture; silicon; thin film transistors; Si; Si thin films; excimer laser crystallization; grain boundary; location-controlled crystal grains; melting-crystallization; n-channel single-grain TFT; p-channel single-grain TFT; random poly-Si TFT; semiconductor device configuration; semiconductor device processing; single-crystal-like characteristics; solid-phase crystallization; thin-film transistors; Acceleration; Crystallization; Grain boundaries; Microelectronics; Semiconductor thin films; Solid lasers; Sputtering; Substrates; Surface emitting lasers; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
Print_ISBN :
0-7803-8684-1
Type :
conf
DOI :
10.1109/IEDM.2004.1419288
Filename :
1419288
Link To Document :
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