DocumentCode
3003833
Title
Warranty cost improvement of machine tools during the bidding process and operation
Author
Lanza, Gisela ; Werner, Patrick ; Behmann, Benjamin ; Appel, Dominic
Author_Institution
Wbk Inst. of Production Sci., Karlsruhe Inst. of Technol., Karlsruhe, Germany
fYear
2011
fDate
24-27 Jan. 2011
Firstpage
1
Lastpage
5
Abstract
In the last decade, reliability improvement warranties (RIW) became increasingly popular with customers of machine tool manufacturers especially in the automotive industry. These RIWs include long term warranties (for up to 10 years) for reliability figures like the Mean Time Between Failure (MTBF). The long warranty period, the stochastic nature of reliability, unknown operational conditions and un certainties regarding the reliability parameters of a component bear the risk of cost through high recourses due to low reliability. The paper shows approaches to lower the risks of high recourses in the bidding process and during operation of machine tools. The methods described in the paper are based on statistical failure analysis with the Weibull distribution and Monte Carlo simulation based warranty prognosis. It is shown that with a good knowledge of the infield reliability of their products, machine tool manufacturers have opportunities to not only calculate but also to lower risks of reliability improvement warranties.
Keywords
Monte Carlo methods; Weibull distribution; failure analysis; machine tools; reliability; warranties; Monte Carlo simulation; Weibull distribution; automotive industry; bidding process; long term warranties; machine tool manufacturers; mean time between failure; reliability improvement warranties; statistical failure analysis; warranty cost improvement; warranty period; warranty prognosis; Accidents; Bellows; Machine tools; Planning; Reliability; Warranties; Reliability Improvement Warranties; Warranty costs prognosis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location
Lake Buena Vista, FL
ISSN
0149-144X
Print_ISBN
978-1-4244-8857-5
Type
conf
DOI
10.1109/RAMS.2011.5754512
Filename
5754512
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