Title :
Active probes for 2-port network analysis within 70-230 GHz
Author :
Wohlgemuth, O. ; Rodwell, M.J.W. ; Reuter, R. ; Braunstein, J. ; Schlechtweg, M.
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys., Freiburg, Germany
Abstract :
Active probes for 2-port on-wafer network analysis within 70-230 GHz are presented. The probe contains an integrated circuit, based on nonlinear transmission lines (NLTL), which has all elements of an S-parameter test set. 2-port measurements with these active probes were carried out. Compared to earlier active probe systems, measurement accuracy is greatly improved.
Keywords :
S-parameters; millimetre wave measurement; network analysers; probes; two-port networks; 70 to 230 GHz; S-parameter measurement; active probe; integrated circuit; nonlinear transmission line; two-port network analysis; Bandwidth; Cables; Circuit testing; Directional couplers; Integrated circuit measurements; Packaging; Probes; Scattering parameters; Signal generators; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.780283
