Title :
A new structure for a six-port reflectometer using a silicon MOSFET for power measurement
Author :
Ratni, M. ; Huyart, B. ; Bergeault, E. ; Jallet, L.
Author_Institution :
Dept. Commun., Ecole Nat. Superieure des Telecommun., Paris, France
Abstract :
This paper presents a new structure for silicon MMIC sixport reflectometer. Its originality lies in the use of a newly developed power detector using a silicon MOSFET transistor as an alternative to the commonly used biased Schottky diode detector. The power detector using a nonbiased MOSFET transistor has demonstrated a better sensitivity than the Schottky diode detector counterpart. The six-port reflectometer calibration uses minimum of five loads with an unknown but constant absolute value of the reflection coefficient and unknown but well-distributed phases. The circuit has been fabricated in silicon MMIC technology working between 0.9-3.0 GHz. A thorough comparison of the measured data with a commercial network analyzer is presented.
Keywords :
MOS analogue integrated circuits; UHF integrated circuits; UHF measurement; calibration; elemental semiconductors; field effect MMIC; microwave reflectometry; power measurement; reflectometers; silicon; 0.9 to 3.0 GHz; MMIC six-port reflectometer; MOSFET; Si; absolute value; calibration; power detector; power measurement; sensitivity; well-distributed phases; CMOS technology; Detectors; MOSFET circuits; Phase detection; Power MOSFET; Power measurement; RF signals; Radio frequency; Schottky diodes; Silicon;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.780286