Title :
Transient Field Measurements With An Ultrafast Scanning Tunneling Microscope on Photoexcited Semiconductor Layers
Author :
Keil, U.D. ; Jensen, J.R. ; Hvam, J.M.
Author_Institution :
Mikroelektronik Centret
Keywords :
Jacobian matrices; Microscopy; Molecular beam epitaxial growth; Nonlinear optics; Optical pumping; Probes; Signal generators; Substrates; Tunneling; Ultrafast optics;
Conference_Titel :
Quantum Electronics Conference, 1998. 1998 EQEC. European
Conference_Location :
Glasgow, UK
Print_ISBN :
0-7803-4231-3
DOI :
10.1109/EQEC.1998.714674
