DocumentCode
3004118
Title
Transient Field Measurements With An Ultrafast Scanning Tunneling Microscope on Photoexcited Semiconductor Layers
Author
Keil, U.D. ; Jensen, J.R. ; Hvam, J.M.
Author_Institution
Mikroelektronik Centret
fYear
1998
fDate
18-18 Sept. 1998
Firstpage
12
Lastpage
12
Keywords
Jacobian matrices; Microscopy; Molecular beam epitaxial growth; Nonlinear optics; Optical pumping; Probes; Signal generators; Substrates; Tunneling; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 1998. 1998 EQEC. European
Conference_Location
Glasgow, UK
Print_ISBN
0-7803-4231-3
Type
conf
DOI
10.1109/EQEC.1998.714674
Filename
714674
Link To Document