• DocumentCode
    3004179
  • Title

    Active learning for large multi-class problems

  • Author

    Jain, Paril ; Kapoor, Ajay

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    762
  • Lastpage
    769
  • Abstract
    Scarcity and infeasibility of human supervision for large scale multi-class classification problems necessitates active learning. Unfortunately, existing active learning methods for multi-class problems are inherently binary methods and do not scale up to a large number of classes. In this paper, we introduce a probabilistic variant of the K-nearest neighbor method for classification that can be seamlessly used for active learning in multi-class scenarios. Given some labeled training data, our method learns an accurate metric/kernel function over the input space that can be used for classification and similarity search. Unlike existing metric/kernel learning methods, our scheme is highly scalable for classification problems and provides a natural notion of uncertainty over class labels. Further, we use this measure of uncertainty to actively sample training examples that maximize discriminating capabilities of the model. Experiments on benchmark datasets show that the proposed method learns appropriate distance metrics that lead to state-of-the-art performance for object categorization problems. Furthermore, our active learning method effectively samples training examples, resulting in significant accuracy gains over random sampling for multi-class problems involving a large number of classes.
  • Keywords
    learning (artificial intelligence); pattern classification; uncertainty handling; K-nearest neighbor method; accuracy gain; active learning; binary method; discriminating capability; distance metric; labeled training data; large multiclass classification problem; metric-kernel function; metric-kernel learning method; object categorization problem; random sampling; similarity search; uncertainty; Humans; Image sampling; Kernel; Labeling; Large-scale systems; Learning systems; Measurement uncertainty; Object recognition; Predictive models; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206651
  • Filename
    5206651