Improved coefficient based test for diagnosing parametric faults of analog circuits

Author

Kavithamani, A. ; Manikandan, V. ; Devarajan, N. ; Ramakrishnan, K.

Author_Institution

Dept. of Electr. & Electron. Eng., Coimbatore Inst. of Technol., Coimbatore, India

fYear

2011

fDate

21-24 Nov. 2011

Firstpage

64

Lastpage

68

Abstract

In this paper an algorithm to identify parametric faults occurring in analog circuits using Transfer Function Coefficients (TFCs) is proposed. From the circuit description and component tolerance specifications, the tolerance boxes of all TFCs are pre computed for fault free circuit and faulty circuit with all possible single faults. For each fault ID a Fuzzy Inference System (FIS) is constructed based on the tolerance boxes of these TFCs. During the test, the actual TFCs are obtained and using the FIS the faulty element is identified. Reliability of the proposed method is verified through a benchmark circuit.

Keywords

analogue circuits; circuit reliability; circuit testing; electronic engineering computing; fault diagnosis; fuzzy reasoning; transfer functions; FIS; TFC; analog circuits; benchmark circuit; circuit description; coefficient-based test; component tolerance specifications; fault ID; fault-free circuit; faulty circuit; fuzzy inference system; parametric fault diagnosis; reliability; tolerance boxes; transfer function coefficients; Analog circuits; Band pass filters; Circuit faults; Fault diagnosis; Instruments; Monte Carlo methods; Transfer functions; fault diagnosis; fuzzy inference system; monte carlo simulation; parametric faults;

fLanguage

English

Publisher

ieee

Conference_Titel

TENCON 2011 - 2011 IEEE Region 10 Conference

Conference_Location

Bali

ISSN

2159-3442

Print_ISBN

978-1-4577-0256-3

Type

conf

DOI

10.1109/TENCON.2011.6129064

Filename

6129064