• DocumentCode
    3004694
  • Title

    Spintronic materials and devices: past, present and future!

  • Author

    Parkin, Stuart S.P.

  • Author_Institution
    IBM Almaden Res. Center, IBM-Stanford Spintronics Sci. & Applications Center, San Jose, CA, USA
  • fYear
    2004
  • fDate
    13-15 Dec. 2004
  • Firstpage
    903
  • Lastpage
    906
  • Abstract
    Spintronics utilizes the electron´s spin to create useful sensors, memory and logic devices with properties not possible with charge based devices. This paper reviews the past successes, and the current and future prospects of spintronic materials and devices. A magnetic random access memory (MRAM) based on a magnetic tunnel junction memory cell promises a high performance memory with high density, speed and nonvolatility: a recent 16 Mb MRAM demonstration chip is described. Two and three terminal tunnel-junction based sources of highly spin polarized current are described as one component of possible spintronic logic devices, which have the potential for much lower power operation than charge based devices. Finally, we discuss a concept for a solid-state memory based on advanced spintronic concepts which promises as much as a hundredfold increase in the capacity of solid state memories, rivaling the capacities of hard disk drives but with no moving parts.
  • Keywords
    magnetic storage; magnetoelectronics; random-access storage; tunnelling magnetoresistance; electron spin; hard disk drives; magnetic random access memory; magnetic tunnel junction memory cell; memory devices; sensors; solid-state memory; spin polarized current; spintronic devices; spintronic logic devices; spintronic materials; Amorphous magnetic materials; CMOS technology; Magnetic sensors; Magnetic separation; Magnetic tunneling; Magnetoelectronics; Polarization; Random access memory; Solid state circuits; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
  • Print_ISBN
    0-7803-8684-1
  • Type

    conf

  • DOI
    10.1109/IEDM.2004.1419328
  • Filename
    1419328