DocumentCode
3004740
Title
StaRSaC: Stable random sample consensus for parameter estimation
Author
Jongmoo Choi ; Medioni, Gerard
Author_Institution
Inst. of Robot. & Intell. Syst., Univ. of Southern California, Los Angeles, CA, USA
fYear
2009
fDate
20-25 June 2009
Firstpage
675
Lastpage
682
Abstract
We address the problem of parameter estimation in presence of both uncertainty and outlier noise. This is a common occurrence in computer vision: feature localization is performed with an inherent uncertainty which can be described as Gaussian, with unknown variance; feature matching in multiple images produces incorrect data points. RANSAC is the preferred method to reject outliers if the variance of the uncertainty noise is known, but fails otherwise, by producing either a tight fit to an incorrect solution, or by computing a solution which includes outliers. We thus propose a new estimator which enforces stability of the solution with respect to the uncertainty bound. We show that the variance of the estimated parameters (VoP) exhibits ranges of stability with respect to this bound. Within this range of stability, we can accurately segment the inliers, and estimate the parameters, the variance of the Gaussian noise. We show how to compute this stable range using RANSAC and a search. We validate our results by extensive tests and comparison with state of the art estimators on both synthetic and real data sets. These include line fitting, homography estimation, and fundamental matrix estimation. The proposed method outperforms all others.
Keywords
Gaussian processes; computer vision; image matching; parameter estimation; Gaussian process; RANSAC; StaRSaC; computer vision; feature localization; feature matching; outlier noise; parameter estimation; random sample consensus; uncertainty noise; Application software; Computer vision; Gaussian noise; Intelligent robots; Intelligent systems; Parameter estimation; Stability; State estimation; Testing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location
Miami, FL
ISSN
1063-6919
Print_ISBN
978-1-4244-3992-8
Type
conf
DOI
10.1109/CVPR.2009.5206678
Filename
5206678
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