DocumentCode :
3004758
Title :
Resolution-Invariant Image Representation and its applications
Author :
Jinjun Wang ; Shenghuo Zhu ; Yihong Gong
Author_Institution :
NEC Labs. America, Inc., Cupertino, CA, USA
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
2512
Lastpage :
2519
Abstract :
We present a resolution-invariant image representation (RIIR) framework in this paper. The RIIR framework includes the methods of building a set of multi-resolution bases from training images, estimating the optimal sparse resolution-invariant representation of any image, and reconstructing the missing patches of any resolution level. As the proposed RIIR framework has many potential resolution enhancement applications, we discuss three novel image magnification applications in this paper. In the first application, we apply the RIIR framework to perform Multi-Scale Image Magnification where we also introduced a training strategy to built a compact RIIR set. In the second application, the RIIR framework is extended to conduct Continuous Image Scaling where a new base at any resolution level can be generated using existing RIIR set on the fly. In the third application, we further apply the RIIR framework onto Content-Base Automatic Zooming applications. The experimental results show that in all these applications, our RIIR based method outperforms existing methods in various aspects.
Keywords :
image enhancement; image reconstruction; image representation; image resolution; content-base automatic zooming application; continuous image scaling; image magnification application; multiresolution base; multiscale image magnification; patch reconstruction; resolution enhancement application; resolution-invariant image representation; training strategy; Image converters; Image reconstruction; Image representation; Image resolution; Interpolation; Markov random fields; Multiresolution analysis; Pixel; Solid modeling; Strontium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
ISSN :
1063-6919
Print_ISBN :
978-1-4244-3992-8
Type :
conf
DOI :
10.1109/CVPR.2009.5206679
Filename :
5206679
Link To Document :
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