• DocumentCode
    3004762
  • Title

    A Multi-sampling SVM Scheme for Current Source Converter with Superior Harmonic Performance

  • Author

    Dai, Jingya ; Lang, Yongqiang ; Wu, Bin ; Xu, Dewei ; Zargari, Navid

  • Author_Institution
    Dept of Electr. & Comput. Eng., Ryerson Univ., Toronto, ON
  • fYear
    2009
  • fDate
    15-19 Feb. 2009
  • Firstpage
    132
  • Lastpage
    138
  • Abstract
    The device switching frequency of current source converters (CSC) in high power medium voltage applications is usually several hundred hertz. Selective harmonic elimination (SHE) has been the dominant modulation scheme because of its ability to eliminate unwanted low order harmonics at low switching frequency. Conventional space vector modulation (SVM), as another CSC modulation method, provides variable modulation index but its output contains low order harmonics with high magnitudes. In this paper, a multi-sampling SVM (MS-SVM) is proposed which substantially suppresses the low order harmonics. Investigation on the switching frequency of the proposed modulation method is carried out and methods to reduce additional switchings are developed. The proposed MS-SVM method exhibits a superior low order harmonics profile comparable to that of SHE and provides the same fast and flexible control capability as the conventional SVM. Simulation and experimental results are provided to verify the proposed method.
  • Keywords
    constant current sources; convertors; harmonics suppression; current source converter; device switching frequency; multi-sampling SVM scheme; selective harmonic elimination; space vector modulation; superior harmonic performance; Medium voltage; Power harmonic filters; Pulse modulation; Pulse width modulation; Pulse width modulation inverters; Resonance; Support vector machines; Switches; Switching converters; Switching frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2009. APEC 2009. Twenty-Fourth Annual IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-2811-3
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2009.4802645
  • Filename
    4802645