DocumentCode
3004825
Title
Microstrip resonator technique for non-destructive moisture/permittivity measurement
Author
Joshi, K.K. ; Pollard, R.D.
Author_Institution
Sir Parshurambhau Coll, Pune, India
Volume
4
fYear
1999
fDate
13-19 June 1999
Firstpage
1863
Abstract
An accurate, instantaneous and nondestructive microstrip resonator technique for measurement of complex permittivity and moisture of materials has been set up. The resonant frequency and the quality factor of microstrip resonator are measured. Complex permittivity/moisture of the material under test is determined with the help of spectral domain analysis of multi-layer microstrips embedded in dielectric cover.
Keywords
microstrip resonators; microwave measurement; moisture measurement; nondestructive testing; permittivity measurement; complex permittivity; dielectric cover; microstrip resonator technique; moisture measurement; multi-layer microstrips; nondestructive measurement; permittivity measurement; quality factor; resonant frequency; spectral domain analysis; Dielectric materials; Dielectric measurements; Frequency measurement; Materials testing; Microstrip resonators; Moisture measurement; Permittivity measurement; Q factor; Resonant frequency; Spectral analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-5135-5
Type
conf
DOI
10.1109/MWSYM.1999.780336
Filename
780336
Link To Document