Title :
Microstrip resonator technique for non-destructive moisture/permittivity measurement
Author :
Joshi, K.K. ; Pollard, R.D.
Author_Institution :
Sir Parshurambhau Coll, Pune, India
Abstract :
An accurate, instantaneous and nondestructive microstrip resonator technique for measurement of complex permittivity and moisture of materials has been set up. The resonant frequency and the quality factor of microstrip resonator are measured. Complex permittivity/moisture of the material under test is determined with the help of spectral domain analysis of multi-layer microstrips embedded in dielectric cover.
Keywords :
microstrip resonators; microwave measurement; moisture measurement; nondestructive testing; permittivity measurement; complex permittivity; dielectric cover; microstrip resonator technique; moisture measurement; multi-layer microstrips; nondestructive measurement; permittivity measurement; quality factor; resonant frequency; spectral domain analysis; Dielectric materials; Dielectric measurements; Frequency measurement; Materials testing; Microstrip resonators; Moisture measurement; Permittivity measurement; Q factor; Resonant frequency; Spectral analysis;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.780336
