• DocumentCode
    3004869
  • Title

    Learning a distance metric from multi-instance multi-label data

  • Author

    Rong Jin ; Shijun Wang ; Zhi-Hua Zhou

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    896
  • Lastpage
    902
  • Abstract
    Multi-instance multi-label learning (MIML) refers to the learning problems where each example is represented by a bag/collection of instances and is labeled by multiple labels. An example application of MIML is visual object recognition in which each image is represented by multiple key points (i.e., instances) and is assigned to multiple object categories. In this paper, we study the problem of learning a distance metric from multi-instance multi-label data. It is significantly more challenging than the conventional setup of distance metric learning because it is difficult to associate instances in a bag with its assigned class labels. We propose an iterative algorithm for MIML distance metric learning: it first estimates the association between instances in a bag and its assigned class labels, and learns a distance metric from the estimated association by a discriminative analysis; the learned metric will be used to update the association between instances and class labels, which is further used to improve the learning of distance metric. We evaluate the proposed algorithm by the task of automated image annotation, a well known MIML problem. Our empirical study shows an encouraging result when combining the proposed algorithm with citation-kNN, a state-of-the-art algorithm for multi-instance learning.
  • Keywords
    image representation; learning (artificial intelligence); citation-kNN; discriminative analysis; distance metric learning; image representation; iterative algorithm; multi-instance multi-label learning; multiple object categories; state-of-the-art algorithm; visual object recognition; Algorithm design and analysis; Computer science; Data engineering; Iterative algorithms; Kernel; Nearest neighbor searches; Radiology; Supervised learning; Support vector machine classification; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206684
  • Filename
    5206684