DocumentCode
3004869
Title
Learning a distance metric from multi-instance multi-label data
Author
Rong Jin ; Shijun Wang ; Zhi-Hua Zhou
Author_Institution
Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
fYear
2009
fDate
20-25 June 2009
Firstpage
896
Lastpage
902
Abstract
Multi-instance multi-label learning (MIML) refers to the learning problems where each example is represented by a bag/collection of instances and is labeled by multiple labels. An example application of MIML is visual object recognition in which each image is represented by multiple key points (i.e., instances) and is assigned to multiple object categories. In this paper, we study the problem of learning a distance metric from multi-instance multi-label data. It is significantly more challenging than the conventional setup of distance metric learning because it is difficult to associate instances in a bag with its assigned class labels. We propose an iterative algorithm for MIML distance metric learning: it first estimates the association between instances in a bag and its assigned class labels, and learns a distance metric from the estimated association by a discriminative analysis; the learned metric will be used to update the association between instances and class labels, which is further used to improve the learning of distance metric. We evaluate the proposed algorithm by the task of automated image annotation, a well known MIML problem. Our empirical study shows an encouraging result when combining the proposed algorithm with citation-kNN, a state-of-the-art algorithm for multi-instance learning.
Keywords
image representation; learning (artificial intelligence); citation-kNN; discriminative analysis; distance metric learning; image representation; iterative algorithm; multi-instance multi-label learning; multiple object categories; state-of-the-art algorithm; visual object recognition; Algorithm design and analysis; Computer science; Data engineering; Iterative algorithms; Kernel; Nearest neighbor searches; Radiology; Supervised learning; Support vector machine classification; Support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location
Miami, FL
ISSN
1063-6919
Print_ISBN
978-1-4244-3992-8
Type
conf
DOI
10.1109/CVPR.2009.5206684
Filename
5206684
Link To Document