Title :
Multi-port scattering matrix measurement using a reduced-port network analyzer
Author :
Hsin-Chia Lu ; Tah-Hsiung Chu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
A novel method to acquire the scattering matrix of an n-port network from the measurements using a reduced-port network analyzer is developed. This method can obtain the scattering matrix of a nonreciprocal or reciprocal n-port network with the use of a three-port or two-port network analyzer. The formulation of this method considers the imperfection of terminators used in the measurement, and only two of the terminators are required to be known. Experimental results of a four-port microstrip circuit show the good accuracy using the developed method.
Keywords :
S-matrix theory; S-parameters; circuit testing; microstrip circuits; microwave measurement; network analysis; two-port networks; 2 to 10 GHz; four-port microstrip circuit; multi-port scattering matrix measurement; n-port network; nonreciprocal n-port network; reciprocal n-port network; reduced-port network analyzer; three-port network analyzer; two-port network analyzer; Circuits; Councils; Degradation; Electric variables measurement; Joining processes; Microstrip; Performance evaluation; Polynomials; Scattering parameters; Transmission line matrix methods;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.780339