DocumentCode
3005006
Title
Angle-resolved entanglement spectroscopy for semiconductor applications
Author
Hoyer, W. ; Bozsoki, P. ; Kira, M. ; Koch, S.W.
Author_Institution
Philipps-Univ., Marburg
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.
Keywords
luminescence; nanostructured materials; photon correlation spectroscopy; angle resolved entanglement spectroscopy; long range disorder fluctuations; luminescence emitted; semiconductor nanostructures; single photon correlation measurements; Energy measurement; Fluctuations; Image reconstruction; Interference; Luminescence; Optical interferometry; Optical scattering; Resonance; Spectroscopy; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/CLEO.2007.4452598
Filename
4452598
Link To Document