Title :
Angle-resolved entanglement spectroscopy for semiconductor applications
Author :
Hoyer, W. ; Bozsoki, P. ; Kira, M. ; Koch, S.W.
Author_Institution :
Philipps-Univ., Marburg
Abstract :
Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.
Keywords :
luminescence; nanostructured materials; photon correlation spectroscopy; angle resolved entanglement spectroscopy; long range disorder fluctuations; luminescence emitted; semiconductor nanostructures; single photon correlation measurements; Energy measurement; Fluctuations; Image reconstruction; Interference; Luminescence; Optical interferometry; Optical scattering; Resonance; Spectroscopy; Stimulated emission;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4452598
