• DocumentCode
    3005050
  • Title

    Super-resolution via recapture and Bayesian effect modeling

  • Author

    Toronto, Neil ; Morse, Bryan S ; Seppi, Kevin ; Ventura, Daniela

  • Author_Institution
    Brigham Young Univ., Provo, UT, USA
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    2388
  • Lastpage
    2395
  • Abstract
    This paper presents Bayesian edge inference (BEI), a single frame super resolution method explicitly grounded in Bayesian inference that addresses issues common to existing methods. Though the best give excellent results at modest magnification factors, they suffer from gradient stepping and boundary coherence problems by factors of 4x. Central to BEI is a causal framework that allows image capture and recapture to be modeled differently, a principled way of undoing downsampling blur, and a technique for incorporating Markov random field potentials arbitrarily into Bayesian networks. Besides addressing gradient and boundary issues, BEI is shown to be competitive with existing methods on published correctness measures. The model and framework are shown to generalize to other reconstruction tasks by demonstrating BEI´s effectiveness at CCD demosaicing and inpainting with only trivial changes.
  • Keywords
    Markov processes; belief networks; image processing; Bayesian edge inference; Markov random field potentials; image capture; image recapture; single frame super resolution method; Bayesian methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206691
  • Filename
    5206691