DocumentCode
3005050
Title
Super-resolution via recapture and Bayesian effect modeling
Author
Toronto, Neil ; Morse, Bryan S ; Seppi, Kevin ; Ventura, Daniela
Author_Institution
Brigham Young Univ., Provo, UT, USA
fYear
2009
fDate
20-25 June 2009
Firstpage
2388
Lastpage
2395
Abstract
This paper presents Bayesian edge inference (BEI), a single frame super resolution method explicitly grounded in Bayesian inference that addresses issues common to existing methods. Though the best give excellent results at modest magnification factors, they suffer from gradient stepping and boundary coherence problems by factors of 4x. Central to BEI is a causal framework that allows image capture and recapture to be modeled differently, a principled way of undoing downsampling blur, and a technique for incorporating Markov random field potentials arbitrarily into Bayesian networks. Besides addressing gradient and boundary issues, BEI is shown to be competitive with existing methods on published correctness measures. The model and framework are shown to generalize to other reconstruction tasks by demonstrating BEI´s effectiveness at CCD demosaicing and inpainting with only trivial changes.
Keywords
Markov processes; belief networks; image processing; Bayesian edge inference; Markov random field potentials; image capture; image recapture; single frame super resolution method; Bayesian methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location
Miami, FL
ISSN
1063-6919
Print_ISBN
978-1-4244-3992-8
Type
conf
DOI
10.1109/CVPR.2009.5206691
Filename
5206691
Link To Document