• DocumentCode
    3005059
  • Title

    Ni-Au surface finish effects on RF performance

  • Author

    Staiculescu, D. ; Laskar, J. ; Mendelsohn, J. ; Sweetman, E. ; Rudy, D. ; Anaki, I.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    4
  • fYear
    1999
  • fDate
    13-19 June 1999
  • Firstpage
    1909
  • Abstract
    We present a simplified analysis of the Nickel-Gold surface finish effects on microstrip conductive losses for boards with different Ni thickness and Ni/Au finish chemistries. Otherwise identical test structures were fabricated with various Ni/Au finishes and different thicknesses. The conductive loss has been extracted from Q measurements on series microstrip resonators. A theoretical model for conductor loss of a two metal layer system has also been proposed. The theoretical approach has been supported with measurement results. For a specific frequency, conductive loss shows an S-curve behavior with Ni thickness.
  • Keywords
    Q-factor; gold; microstrip resonators; nickel; surface treatment; Ni-Au; Q-factor; RF characteristics; conductor loss; microstrip resonator; nickel-gold surface finish; Chemical technology; Conductivity; Conductors; Copper; Gold; Microstrip resonators; Q measurement; Radio frequency; Surface finishing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1999 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    0-7803-5135-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1999.780347
  • Filename
    780347