An investigation of center-conductor corrugation effects in coaxial gyrotron cavities

Summary form only given, as follows. An analysis of coaxial gyrotron cavities has been carried out in which tapering of the longitudinal corrugations of the center conductor has been investigated. A model has been developed in which the tapering is incorporated. The results from this model will be compared with the average surface impedance model of Iatrou et al. (1996), which served as the starting point for the new approach. The effects of corrugation tapering are examined in the context of coaxial cavity eigenvalue /spl chi//sub mp/ variation with the radii ratio C. A study of the field components for certain TE/sub mp/ modes is also presented. Planned experiments that will seek to characterize the cavities under cold-test conditions will be discussed.