Title :
The Influence of Electron-Beam Irradiation on the Characters of GaN-Based Light Emitting Diodes
Author :
Yu Liyuan ; Niu Pingjuan ; Hou Sha
Author_Institution :
Sch. of Electr. Eng. & Autom., Tianjin Polytech. Univ., Tianjin, China
Abstract :
Light emitting diodes (LEDs) is an important solid-state light source, which has the advantage of long lifetime and low cost. As a semiconductor photoelectric device, the electron-beam irradiation on LEDs brings the deep level defect acting as the compensation of the chemical doping in LEDs. In this paper the influence of low-energy and low-dose electron-beam irradiation on the GaN-based LEDs has been studied. It is observed that the light intensity of irradiated LEDs emitting increases, and the electronic parameters are mainly unchanged. And the electron beam irradiation mechanism of the experiment results are discussed and analyzed.
Keywords :
III-V semiconductors; electron beam effects; gallium compounds; light emitting diodes; light sources; photoelectric devices; semiconductor doping; wide band gap semiconductors; LED; chemical doping; electron-beam irradiation; light emitting diodes; light intensity; semiconductor photoelectric device; solid-state light source; Educational institutions; Electron beams; Gallium nitride; Light emitting diodes; Light sources; Radiation effects; Spontaneous emission;
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2012 Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-0909-8
DOI :
10.1109/SOPO.2012.6271097