• DocumentCode
    3005988
  • Title

    The Influence of Electron-Beam Irradiation on the Characters of GaN-Based Light Emitting Diodes

  • Author

    Yu Liyuan ; Niu Pingjuan ; Hou Sha

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Tianjin Polytech. Univ., Tianjin, China
  • fYear
    2012
  • fDate
    21-23 May 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Light emitting diodes (LEDs) is an important solid-state light source, which has the advantage of long lifetime and low cost. As a semiconductor photoelectric device, the electron-beam irradiation on LEDs brings the deep level defect acting as the compensation of the chemical doping in LEDs. In this paper the influence of low-energy and low-dose electron-beam irradiation on the GaN-based LEDs has been studied. It is observed that the light intensity of irradiated LEDs emitting increases, and the electronic parameters are mainly unchanged. And the electron beam irradiation mechanism of the experiment results are discussed and analyzed.
  • Keywords
    III-V semiconductors; electron beam effects; gallium compounds; light emitting diodes; light sources; photoelectric devices; semiconductor doping; wide band gap semiconductors; LED; chemical doping; electron-beam irradiation; light emitting diodes; light intensity; semiconductor photoelectric device; solid-state light source; Educational institutions; Electron beams; Gallium nitride; Light emitting diodes; Light sources; Radiation effects; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics (SOPO), 2012 Symposium on
  • Conference_Location
    Shanghai
  • ISSN
    2156-8464
  • Print_ISBN
    978-1-4577-0909-8
  • Type

    conf

  • DOI
    10.1109/SOPO.2012.6271097
  • Filename
    6271097