Capacitance coupling immune, transient sensitive accelerator for resistive interconnection signals of sub-quarter micron ULSI

Author

Iima, Tomofumi ; Mizuno, Masayuki ; Horiuchi, Tadahiko ; Yamashina, Masakazu

Author_Institution

Microelectron. Res. Labs., NEC Corp., Kanagawa, Japan

fYear

1995

fDate

8-10 June 1995

Firstpage

31

Lastpage

32

Abstract

We have developed a new circuit scheme that reduces the delay time caused by large interconnection resistances. Also, this circuit immunizes cross talk caused at scaled interconnections of sub-quarter micron ULSIs. The reduction of the delay time is 60% and output fluctuation is improved to negligibly small magnitude. The proposed circuit can be applied to bi-directional signal communication without adding further hardware and is extremely useful for sub-quarter micron ULSIs with scaled resistive interconnections.

Keywords

ULSI; crosstalk; integrated circuit interconnections; transient analysis; trigger circuits; bi-directional signal communication; capacitance coupling; cross talk; delay time; output fluctuation; resistive interconnections; sub-quarter micron ULSI; transient sensitive accelerator circuit; Capacitance; Circuit noise; Crosstalk; Delay effects; Driver circuits; Integrated circuit interconnections; Inverters; Laboratories; Large scale integration; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on

Conference_Location

Kyoto, Japan

Print_ISBN

0-7800-2599-0

Type

conf

DOI

10.1109/VLSIC.1995.520674

Filename

520674