• DocumentCode
    3006221
  • Title

    Hazardous Waste Concerns & Solutions in a Microelectronics Laboratory

  • Author

    Woodie, Daniel

  • Author_Institution
    Cornell NanoScale Facility, Cornell Univ., Ithaca, NY, USA
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Microelectronic labs create some common classes of hazardous waste from solutions such as piranha etch, RCA cleans, etc. Safely handling these solutions while complying with EPA hazardous waste regulations can be a challenge. This presentation will briefly cover some of the regulations dealing with these issues and how the Cornell NanoScale Facility (CNF) has worked to follow them. Over the years, various incidents have occurred that have lead to the CNF developing some unique solutions to a few of these problems commonly facing labs handling this type of waste. An overview of some of these incidents will be presented, along with the solutions developed to mitigate future risk.
  • Keywords
    hazardous materials; integrated circuits; waste handling; Cornell NanoScale Facility; EPA hazardous waste regulation; microelectronic laboratory; Biomembranes; Chemical hazards; Chemical processes; Containers; Gases; Laboratories; Microelectronics; Plastics; Testing; Waste handling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro/Nano Symposium (UGIM), 2010 18th Biennial University/Government/Industry
  • Conference_Location
    West Lafayette, IN
  • ISSN
    0749-6877
  • Print_ISBN
    978-1-4244-4731-2
  • Electronic_ISBN
    0749-6877
  • Type

    conf

  • DOI
    10.1109/UGIM.2010.5508852
  • Filename
    5508852