Title :
Silicon Emitter Failure Initiation
Author :
Bintz, WJ ; McGruer, N.E.
Author_Institution :
Northeastern University
Keywords :
Application software; Circuit testing; Computer displays; Current measurement; Electrons; Microelectronics; Silicon; Surface contamination; Vacuum arcs; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
DOI :
10.1109/IVMC.1993.700303
