DocumentCode :
3006280
Title :
Novel Photoluminescence from Porous SiGe/Si Multilayer Structure
Author :
Bi Zhou ; Li, Xuemei ; Pan, Shuwan ; Chen, Songyan ; Li, Cheng
Author_Institution :
Dept. of Phys. & Electron. Inf. Eng., Minjiang Univ., Fuzhou, China
fYear :
2012
fDate :
21-23 May 2012
Firstpage :
1
Lastpage :
3
Abstract :
The optical properties of porous SiGe/Si multilayer films prepared through electrochemical anodization have been investigated. The visible luminescence spectra with multiple emission peaks have been detected in the temperature range from 10 K to room temperature. Photoluminescence (PL) with narrow band width is observed due to the wavelength selective effect of the microcavity. The resonance of the microcavity is confirmed by the temperature dependent PL measurement and the reflectance spectrum, which is consisted with the prediction from the thermo-optic effect.
Keywords :
Ge-Si alloys; anodisation; chemical vapour deposition; electrochemistry; elemental semiconductors; microcavities; multilayers; photoluminescence; porous semiconductors; reflectivity; semiconductor growth; semiconductor thin films; thermo-optical effects; vacuum deposition; SiGe-Si; chemical vapour deposition; electrochemical anodization; microcavity; multiple emission peaks; optical properties; photoluminescence; porous multilayer structure; reflectance spectrum; temperature 10 K to 298 K; thermo-optic effect; ultrahigh vacuum chemical vapor deposition; visible luminescence spectra; wavelength selective effect; Cavity resonators; Nonhomogeneous media; Photoluminescence; Silicon; Silicon germanium; Temperature; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2012 Symposium on
Conference_Location :
Shanghai
ISSN :
2156-8464
Print_ISBN :
978-1-4577-0909-8
Type :
conf
DOI :
10.1109/SOPO.2012.6271109
Filename :
6271109
Link To Document :
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