DocumentCode
3006355
Title
Convexity and Bayesian constrained local models
Author
Paquet, Ulrich
Author_Institution
Imense Ltd., Cambridge, UK
fYear
2009
fDate
20-25 June 2009
Firstpage
1193
Lastpage
1199
Abstract
The accurate localization of facial features plays a fundamental role in any face recognition pipeline. Constrained local models (CLM) provide an effective approach to localization by coupling ensembles of local patch detectors for non-rigid object alignment. A recent improvement has been made by using generic convex quadratic fitting (CQF), which elegantly addresses the CLM warp update by enforcing convexity of the patch response surfaces. In this paper, CQF is generalized to a Bayesian inference problem, in which it appears as a particular maximum likelihood solution. The Bayesian viewpoint holds many advantages: for example, the task of feature localization can explicitly build on previous face detection stages, and multiple sets of patch responses can be seamlessly incorporated. A second contribution of the paper is an analytic solution to finding convex approximations to patch response surfaces, which removes CQF´s reliance on a numeric optimizer. Improvements in feature localization performance are illustrated on the Labeled Faces in the Wild and BioID data sets.
Keywords
Bayes methods; approximation theory; face recognition; feature extraction; maximum likelihood estimation; object detection; Bayesian constrained local model; Bayesian inference problem; CLM warp update; convex approximation; face detection; face recognition pipeline; facial features; feature localization performance; generic convex quadratic fitting; local patch detector; maximum likelihood solution; nonrigid object alignment; patch response surfaces; Bayesian methods; Detectors; Face detection; Face recognition; Facial features; Maximum likelihood detection; Object detection; Pipelines; Response surface methodology; Surface fitting;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location
Miami, FL
ISSN
1063-6919
Print_ISBN
978-1-4244-3992-8
Type
conf
DOI
10.1109/CVPR.2009.5206751
Filename
5206751
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