DocumentCode :
3006580
Title :
Bright-field Analysis Of Field-emission Cones Using High-resolution Transmission Electron Microscopy
Author :
Goodhue, W.D. ; Nitishin, P.M. ; Harris, C.T. ; Bozler, C.O. ; Rathman, D.D. ; Johnson, G.D. ; Hollis, M.A.
Author_Institution :
Massachusetts Institute of Technology
fYear :
1993
fDate :
12-15 Jul 1993
Firstpage :
112
Lastpage :
113
Keywords :
Cathodes; Electron emission; High-resolution imaging; Image resolution; Laboratories; Microelectronics; Performance analysis; Shape; Transmission electron microscopy; Vacuum technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
Type :
conf
DOI :
10.1109/IVMC.1993.700305
Filename :
700305
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3006580
بازگشت