DocumentCode :
3006606
Title :
Illumination and spatially varying specular reflectance from a single view
Author :
Hara, Kentaro ; Nishino, K.
Author_Institution :
Dept. of Visual Commun. Design, Kyushu Univ., Japan
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
619
Lastpage :
626
Abstract :
Estimating the illumination and the reflectance properties of an object surface from a sparse set of images is an important but inherently ill-posed problem. The problem becomes even harder if we wish to account for the spatial variation of material properties on the surface. In this paper, we derive a novel method for estimating the spatially varying specular reflectance properties, of a surface of known geometry, as well as the illumination distribution from a specular-only image, for instance, captured using polarization to separate reflection components. Unlike previous work, we do not assume the illumination to be a single point light source. We model specular reflection with a spherical statistical distribution and encode the spatial variation with radial basis functions of its parameters. This allows us to formulate the simultaneous estimation of spatially varying specular reflectance and illumination as a sound probabilistic inference problem, in particular, using Csiszar´s I-divergence measure. To solve it, we derive an iterative algorithm similar to expectation maximization. We demonstrate the effectiveness of the method on synthetic and real-world scenes.
Keywords :
expectation-maximisation algorithm; image coding; iterative methods; radial basis function networks; statistical distributions; Csiszar I-divergence measure; a sound probabilistic inference problem; expectation maximization; ill-posed problem; illumination distribution; illumination estimation; iterative algorithm; polarization; radial basis function; spatial varying specular reflectance; specular reflection model; spherical statistical distribution; Acoustic reflection; Geometry; Light sources; Lighting; Material properties; Optical polarization; Optical reflection; Particle measurements; Reflectivity; Statistical distributions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
ISSN :
1063-6919
Print_ISBN :
978-1-4244-3992-8
Type :
conf
DOI :
10.1109/CVPR.2009.5206764
Filename :
5206764
Link To Document :
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