Title :
SiC Wirebond Multi-Chip Phase-Leg Module Packaging Design and Testing for Harsh Environment
Author :
Ning, Puqi ; Lai, Rixin ; Huff, Daniel ; Wang, Fred ; Ngo, Khai D T
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
Abstract :
In order to take full advantage of SiC, a high temperature wirebond package for multi-chip phase-leg power module using SiC devices was designed, developed, fabricated and tested. The details of the material selection and thermo-mechanical reliability evaluation are described. High temperature power test shows that the package presented in this paper can perform well at the high junction temperature.
Keywords :
lead bonding; power semiconductor devices; junction temperature; thermomechanical reliability evaluation; wirebond multichip phase-leg power module packaging design; Assembly; Electronic equipment testing; Electronics packaging; Materials reliability; Multichip modules; Semiconductor device packaging; Silicon carbide; System testing; Temperature; Thermomechanical processes;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2009. APEC 2009. Twenty-Fourth Annual IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-2811-3
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2009.4802725