DocumentCode :
3006748
Title :
Silicon Carbide Emitter Turn-off Thyristor, A Promising Technology For High Voltage and High Frequency Applications
Author :
Wang, Jun ; Wang, Gangyao ; Li, Jun ; Huang, Alex Q.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC
fYear :
2009
fDate :
15-19 Feb. 2009
Firstpage :
658
Lastpage :
664
Abstract :
A novel MOS-controlled SiC thyristor device, the SiC emitter turn-off thyristor (ETO), as a promising technology for future high voltage high frequency switching applications has been developed. The world´s first 4.5-kV SiC p type ETO prototype based on a 0.36 cm2 SiC p type GTO shows a forward voltage drop of 4.6 V at a current density of 25 A/cm2 and a turn-off energy loss of 9.88 mJ. The low loss indicates that the SiC ETO could operate at a 4 kHz frequency with a conventional thermal management system. This frequency capability is about 4 times higher than the 4.5-kV-class silicon power devices. The numerical simulations have been carried out to discuss the potential improvement of the high voltage (10-kV) SiC ETOs. The results show that the 10-kV SiC n type ETO has much better trade-off performance than that of the p type ETO due to a smaller current gain of the internal lower (PNP) bipolar transistor in the SiC n type GTO. The experimental and theoretical studies show that the SiC ETO is a promising candidate for high-voltage (>5-kV) high-frequency power conversion applications.
Keywords :
MIS devices; power semiconductor devices; silicon compounds; thyristors; MOS-controlled thyristor device; SiC; bipolar transistor; emitter turn-off thyristor; energy 9.88 mJ; frequency 4 kHz; high frequency applications; high voltage applications; high-frequency power conversion; numerical simulations; thermal management system; voltage 10 kV; voltage 4.5 kV; Current density; Energy loss; Frequency; Numerical simulation; Power system management; Prototypes; Silicon carbide; Thermal management; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2009. APEC 2009. Twenty-Fourth Annual IEEE
Conference_Location :
Washington, DC
ISSN :
1048-2334
Print_ISBN :
978-1-4244-2811-3
Electronic_ISBN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.2009.4802730
Filename :
4802730
Link To Document :
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