• DocumentCode
    3006754
  • Title

    Anomaly detection in extremely crowded scenes using spatio-temporal motion pattern models

  • Author

    Kratz, Louis ; Nishino, K.

  • Author_Institution
    Dept. of Comput. Sci., Drexel Univ., Philadelphia, PA, USA
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    1446
  • Lastpage
    1453
  • Abstract
    Extremely crowded scenes present unique challenges to video analysis that cannot be addressed with conventional approaches. We present a novel statistical framework for modeling the local spatio-temporal motion pattern behavior of extremely crowded scenes. Our key insight is to exploit the dense activity of the crowded scene by modeling the rich motion patterns in local areas, effectively capturing the underlying intrinsic structure they form in the video. In other words, we model the motion variation of local space-time volumes and their spatial-temporal statistical behaviors to characterize the overall behavior of the scene. We demonstrate that by capturing the steady-state motion behavior with these spatio-temporal motion pattern models, we can naturally detect unusual activity as statistical deviations. Our experiments show that local spatio-temporal motion pattern modeling offers promising results in real-world scenes with complex activities that are hard for even human observers to analyze.
  • Keywords
    human factors; image motion analysis; image recognition; video signal processing; anomaly detection; extremely crowded scenes; local space-time volumes; local spatio-temporal motion pattern behavior; motion variation; rich motion patterns; spatial-temporal statistical behaviors; spatio-temporal motion pattern models; steady-state motion behavior; video analysis; Event detection; Hidden Markov models; Humans; Image motion analysis; Layout; Motion analysis; Motion detection; Pattern analysis; Ultraviolet sources; Video sequences;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206771
  • Filename
    5206771