Title :
High Temperature Device Characterization for Hybrid Electric Vehicle Traction Inverters
Author :
Lai, Jih-Sheng ; Yu, Wensong ; Qian, Hao ; Sun, Pengwei ; Ralston, Parish ; Meehan, Kathleen
Author_Institution :
Future Energy Electron. Center, Virginia Polytech. Inst. & State Univ., Blacksburg, VA
Abstract :
High temperature inverter involves thermal management, packaging, semiconductor device, switching circuit, and control circuitry. This paper is to focus on the drivetrain inverter design consideration for electric and hybrid electric vehicles. Basic structure and switching characteristics of different insulated-gate-bipolar-transistors (IGBTs) will be discussed. The use of silicon carbide Schottky diode in parallel with silicon IGBT will also be evaluated and compared with pure silicon IGBT modules running under both hard- and soft-switching conditions. Experimental results of conduction and switching loss at different temperature conditions are used to predict the device loss and associated junction temperature for switching cases.
Keywords :
Schottky diodes; hybrid electric vehicles; invertors; power semiconductor switches; silicon compounds; traction; conduction loss; control circuitry; drivetrain inverter; high temperature device characterization; hybrid electric vehicle; insulated-gate-bipolar-transistors; semiconductor device; silicon carbide Schottky diode; switching circuit; switching loss; thermal management; traction inverters; Hybrid electric vehicles; Insulated gate bipolar transistors; Insulation; Inverters; Semiconductor device packaging; Semiconductor devices; Silicon; Switching circuits; Temperature control; Thermal management; High temperature; device characterization; hybrid electric vehicle; traction inverter;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2009. APEC 2009. Twenty-Fourth Annual IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-2811-3
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2009.4802731