Eigen parameters of quasiperiodic Bragg nanostructures

Author

Andreev, M.V. ; Borulko, V.F. ; Drobakhin, O.O. ; Sidorov, D.V.

Author_Institution

Dept. of Phys., Electron. & Comput. Syst., Oles Honchar Nat. Univ. of Dnepropetrovsk, Dnepropetrovsk, Ukraine

fYear

2015

fDate

21-24 April 2015

Firstpage

188

Lastpage

193

Abstract

The influence of various types of apodization on the eigen parameters of the distributed Bragg reflector, layered Bragg reflectors and resonators has been analyzed. The conditions of reduction of the quality factor of unwanted side Bragg oscillations in quasiperiodic apodized resonators have been determined. It has been proposed the construction of periodic and quasiperiodic structures and apodized Bragg resonators with thin contrast layers, which are relatively easy technologically implemented in the microwave range. The measurement results of reflection coefficient for periodic and quasiperiodic apodized structures and resonators with thin contrast layers are presented.

Keywords

nanophotonics; optical resonators; Bragg oscillations; Bragg resonators; distributed Bragg reflector; eigen parameters; layered Bragg reflectors; quality factor; quasiperiodic Bragg nanostructures; quasiperiodic structures; Distributed Bragg reflectors; Optical resonators; Periodic structures; Permittivity; Q-factor; Reflection; Resonant frequency; apodized Bragg resonators; eigen permittivity; eigenfrequencies; structure with thin contrast layers;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics and Nanotechnology (ELNANO), 2015 IEEE 35th International Conference on

Conference_Location

Kiev

Type

conf

DOI

10.1109/ELNANO.2015.7146869

Filename

7146869