DocumentCode :
3006785
Title :
Microstructural Characterization Of Spindt Cathodes
Author :
Macaulay, J.M. ; Liddle, J.A. ; Spindt, C.A.
Author_Institution :
Silicon Video Corporation
fYear :
1993
fDate :
12-15 Jul 1993
Firstpage :
114
Lastpage :
114
Keywords :
Brightness; Cathodes; Crystallization; Electron emission; Image resolution; Microstructure; Scanning electron microscopy; Semiconductor thin films; Silicon; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
Type :
conf
DOI :
10.1109/IVMC.1993.700306
Filename :
700306
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3006785
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