Title :
Voltage-comparator-based measurement of equivalently sampled substrate noise waveform in mixed-signal integrated circuits
Author :
Makie-Fukuda, K. ; Anbo, T. ; Tsukada, T. ; Matsuura, T. ; Hotta, M.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
A method is proposed for measuring substrate noise waveforms in mixed-signal integrated circuits. This method uses wideband chopper-type single-ended voltage comparators as on-chip noise detectors. By analyzing the equivalently sampled comparator outputs from synchronized operation, the noise voltages in auto-zero and compare modes can be separately detected and the noise waveforms can be reconstructed within 2-nsec accuracy. The measured results also explain the influence of noise coupling on analog circuits widely used in on-chip analog to digital converters.
Keywords :
choppers (circuits); comparators (circuits); electric noise measurement; integrated circuit measurement; integrated circuit noise; mixed analogue-digital integrated circuits; synchronisation; 2 ns; auto-zero mode; compare mode; equivalently sampled comparator outputs; equivalently sampled substrate noise waveform; mixed-signal integrated circuits; noise coupling; noise waveforms; on-chip noise detectors; synchronized operation; voltage-comparator-based measurement; wideband chopper-type single-ended voltage comparators; Analog circuits; Circuit noise; Coupling circuits; Detectors; Integrated circuit measurements; Integrated circuit noise; Mixed analog digital integrated circuits; Noise measurement; Voltage; Wideband;
Conference_Titel :
VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
0-7800-2599-0
DOI :
10.1109/VLSIC.1995.520678
