Title :
A similarity measure between vector sequences with application to handwritten word image retrieval
Author :
Rodriguez-Serrano, Jose A ; Perronnin, Florent ; Llados, Josep ; Sanchez, Gustavo
Author_Institution :
Loughborough Univ., Loughborough, UK
Abstract :
This article proposes a novel similarity measure between vector sequences. Recently, a model-based approach was introduced to address this issue. It consists in modeling each sequence with a continuous Hidden Markov Model (CHMM) and computing a probabilistic measure of similarity between C-HMMs. In this paper we propose to model sequences with semi-continuous HMMs (SC-HMMs): the Gaussians of the SC-HMMs are constrained to belong to a shared pool of Gaussians. This constraint provides two major benefits. First, the a priori information contained in the common set of Gaussians leads to a more accurate estimate of the HMM parameters. Second, the computation of a probabilistic similarity between two SC-HMMs can be simplified to a Dynamic Time Warping (DTW) between their mixture weight vectors, which reduces significantly the computational cost. Experimental results on a handwritten word retrieval task show that the proposed similarity outperforms the traditional DTW between the original sequences, and the model-based approach which uses C-HMMs. We also show that this increase in accuracy can be traded against a significant reduction of the computational cost (up to 100 times).
Keywords :
Gaussian processes; handwritten character recognition; hidden Markov models; image retrieval; continuous hidden Markov model; dynamic time warping; handwritten word image retrieval; model-based approach; probabilistic measure computing; probabilistic similarity; semicontinuous HMMs; similarity measure; vector sequences; Application software; Computational efficiency; Computer vision; Distributed computing; Gaussian processes; Hidden Markov models; Image retrieval; Kernel; Pattern recognition; Probability distribution;
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4244-3992-8
DOI :
10.1109/CVPR.2009.5206783