• DocumentCode
    3007173
  • Title

    On the numerical stability of RF power amplifier´s digital predistortion

  • Author

    Wu, Xiaofang ; Shi, Jianghong ; Chen, Huihuang

  • Author_Institution
    Sch. of Inf. Sci. & Technol., Xiamen Univ., Xiamen, China
  • fYear
    2009
  • fDate
    8-10 Oct. 2009
  • Firstpage
    430
  • Lastpage
    433
  • Abstract
    Digital predistortion (DPD) is a highly cost-effective technique to linearize high power amplifiers (HPAs) in wireless applications. The polynomial-type behavior models are widely used both for HPAs and predistorters, but they often suffer from the numerical stability problem when the higher order nonlinearities are included. When wideband signals are transmitted, the envelope impedances of HPAs can not always keep constant, therefore the envelope frequency components caused by the even-order nonlinearities become the main source of the memory effect of HPAs. In this paper, we propose a new polynomial predistorter model considering the influence of the envelope frequency components, which shows better performance in out-of-band spectral suppression; then, we propose a dual-orthogonal-basis polynomial model for complex Gaussian inputs, which alleviate the numerical instability of digital predistortion.
  • Keywords
    nonlinear distortion; numerical stability; polynomials; power amplifiers; radiofrequency amplifiers; RF power amplifier; digital predistortion; dual-orthogonal-basis polynomial for; envelope frequency components; high power amplifiers; higher order nonlinearities; numerical stability; out-of-band spectral suppression; polynomial predistorter model; Broadband amplifiers; High power amplifiers; Impedance; Numerical stability; Polynomials; Power amplifiers; Predistortion; Radio frequency; Radiofrequency amplifiers; Wideband; numerical stability; orthogonal polynomials; power amplifiers; predistortion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 2009. APCC 2009. 15th Asia-Pacific Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-4784-8
  • Electronic_ISBN
    978-1-4244-4785-5
  • Type

    conf

  • DOI
    10.1109/APCC.2009.5375601
  • Filename
    5375601