Title :
Investigation of Catastrophic Optical Mirror Damage in High Power Single-Mode InGaAs-AlGaAs Strained Quantum Well Lasers with Focused Ion Beam and HR-TEM Techniques
Author :
Sin, Yongkun ; Presser, Nathan ; Foran, Brendan ; Mason, Maribeth ; Moss, Steven C.
Author_Institution :
Aerosp. Corp., El Segundo
Abstract :
We report our investigation of catastrophic optical mirror damage (COMD) in 980 nm high power single spatial mode InGaAs-AlGaAs strained quantum well (QW) lasers using focused ion beam (FIB) and high-resolution transmission electron microscope (HR-TEM) techniques.
Keywords :
III-V semiconductors; aluminium compounds; focused ion beam technology; gallium arsenide; indium compounds; laser cavity resonators; laser mirrors; quantum well lasers; transmission electron microscopy; FIB; InGaAs-AlGaAs; TEM; catastrophic optical mirror damage; focused ion beam techniques; high power single spatial mode strained quantum well lasers; high-resolution transmission electron microscope techniques; wavelength 980 nm; Electron beams; Electron optics; Ion beams; Laser modes; Mirrors; Optical microscopy; Particle beam optics; Power lasers; Quantum well lasers; Transmission electron microscopy;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4452726
