• DocumentCode
    3007295
  • Title

    Investigation of Catastrophic Optical Mirror Damage in High Power Single-Mode InGaAs-AlGaAs Strained Quantum Well Lasers with Focused Ion Beam and HR-TEM Techniques

  • Author

    Sin, Yongkun ; Presser, Nathan ; Foran, Brendan ; Mason, Maribeth ; Moss, Steven C.

  • Author_Institution
    Aerosp. Corp., El Segundo
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We report our investigation of catastrophic optical mirror damage (COMD) in 980 nm high power single spatial mode InGaAs-AlGaAs strained quantum well (QW) lasers using focused ion beam (FIB) and high-resolution transmission electron microscope (HR-TEM) techniques.
  • Keywords
    III-V semiconductors; aluminium compounds; focused ion beam technology; gallium arsenide; indium compounds; laser cavity resonators; laser mirrors; quantum well lasers; transmission electron microscopy; FIB; InGaAs-AlGaAs; TEM; catastrophic optical mirror damage; focused ion beam techniques; high power single spatial mode strained quantum well lasers; high-resolution transmission electron microscope techniques; wavelength 980 nm; Electron beams; Electron optics; Ion beams; Laser modes; Mirrors; Optical microscopy; Particle beam optics; Power lasers; Quantum well lasers; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/CLEO.2007.4452726
  • Filename
    4452726
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3007295