Title :
An efficient tree-based algorithm for computing path delay fault coverage
Author :
Kapoor, Bhanu ; Nair, V.S.S.
Author_Institution :
Intergated Syst. Lab., Texas Instrum. Inc., Dallas, TX, USA
Abstract :
A new algorithm for the efficient computation of path delay fault coverage for circuits with very large number of path delay faults has been presented. The directed acyclic graph representing a combinational circuit consists of a set of trees rooted at the fanout and output nodes. The algorithm uses a tree-based marking process to compute the path delay fault coverage of a given delay-test set in linear time and memory. The root of a tree is marked as used only when it has been tested with respect to the rising and falling path delay faults passing through all the leaves of the tree. The algorithm takes advantage of large tree structures found in most digital designs, to provide a reasonably accurate and very efficient method for the estimation of path delay fault coverage. Some results obtained using non-robust simulation of benchmark circuits suggest the viability and validity of our approach
Keywords :
circuit analysis computing; combinational circuits; delays; directed graphs; fault diagnosis; logic testing; trees (mathematics); benchmark circuits; combinational circuit; delay-test set; directed acyclic graph; fanout nodes; large tree structures; linear time; nonrobust simulation; output nodes; path delay fault coverage; tree-based algorithm; tree-based marking process; Algorithm design and analysis; Circuit faults; Circuit simulation; Combinational circuits; Delay effects; Delay estimation; Delay lines; Testing; Tree data structures; Tree graphs;
Conference_Titel :
ASIC Conference and Exhibit, 1994. Proceedings., Seventh Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-2020-4
DOI :
10.1109/ASIC.1994.404530