Title :
Analog built-in self-test
Author :
Nejad, Mohammad S. ; Sebaa, Lahouari ; Ladick, Andrew ; Kuo, Henry
Author_Institution :
Western Digital Corp., Irvine, CA, USA
Abstract :
This paper presents comprehensive approaches for on-chip measurements of passive components. Built-in test circuitry is shown to illustrate the concept of measuring certain external passive components without the need for test pads on the board. Built-In Self-Test techniques for Digital to Analog Converters (BIST DAC) are also presented. Combined properly with the IEEE Test Standard 1149.1, these self-test techniques can be easily controlled at various test stages
Keywords :
IEEE standards; analogue integrated circuits; built-in self test; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; IEEE Test Standard 1149.1; analogue ICs; built-in self-test; design for testability; digital to analog converters; external passive components; mixed-signal devices; self-test techniques; test stages; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Design for testability; Digital-analog conversion; Integrated circuit measurements; Resistors; Switches; Voltage;
Conference_Titel :
ASIC Conference and Exhibit, 1994. Proceedings., Seventh Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-2020-4
DOI :
10.1109/ASIC.1994.404532
