DocumentCode
3007637
Title
Analog built-in self-test
Author
Nejad, Mohammad S. ; Sebaa, Lahouari ; Ladick, Andrew ; Kuo, Henry
Author_Institution
Western Digital Corp., Irvine, CA, USA
fYear
1994
fDate
19-23 Sep 1994
Firstpage
407
Lastpage
411
Abstract
This paper presents comprehensive approaches for on-chip measurements of passive components. Built-in test circuitry is shown to illustrate the concept of measuring certain external passive components without the need for test pads on the board. Built-In Self-Test techniques for Digital to Analog Converters (BIST DAC) are also presented. Combined properly with the IEEE Test Standard 1149.1, these self-test techniques can be easily controlled at various test stages
Keywords
IEEE standards; analogue integrated circuits; built-in self test; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; IEEE Test Standard 1149.1; analogue ICs; built-in self-test; design for testability; digital to analog converters; external passive components; mixed-signal devices; self-test techniques; test stages; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Design for testability; Digital-analog conversion; Integrated circuit measurements; Resistors; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Conference and Exhibit, 1994. Proceedings., Seventh Annual IEEE International
Conference_Location
Rochester, NY
Print_ISBN
0-7803-2020-4
Type
conf
DOI
10.1109/ASIC.1994.404532
Filename
404532
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