DocumentCode :
3007654
Title :
Plastic Packaging Consortium-first year results
Author :
Nguyen, L.T. ; Giberti, R.W.
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear :
1996
fDate :
28-31 May 1996
Firstpage :
1239
Lastpage :
1243
Abstract :
The Plastic Packaging Consortium is a funded Technology Reinvestment Project (TRP) awarded in the FY94 competition on low-cost electronic packaging. The ten companies $20M+ cost-shared effort, led by National Semiconductor Corp., will establish the on-shore infrastructure to manufacture low-cost, high density, high performance “ruggedized” plastic packages. This initiative comes from the increasing need to improve complexity, performance, and reliability of plastic packages for both military and commercial use, while lowering the total system cost. The Program focuses on three areas of improvement: (1) plastic package “ruggedization”; (2) plastic package thermal enhancement; and, (3) high density plastic packages. Advances in molding compounds, die attach materials, leadframe materials, leadframe design, and reliability characterization will be accomplished. The deliverables at the end of the two-year Program will be plastic package processes and materials, which require no dry-bagging, eliminate “popcorning”, improve low-cost (stamped) fine pitch leadframes, and utilize low-cost interconnect processes for high density packaging. This paper reports the results obtained in the three focus areas after the first year of activities
Keywords :
fine-pitch technology; integrated circuit interconnections; integrated circuit packaging; plastic packaging; reliability; research initiatives; Plastic Packaging Consortium; Technology Reinvestment Project; die attach materials; fine pitch leadframes; high density packaging; leadframe design; leadframe materials; low-cost electronic packaging; low-cost interconnect processes; molding compounds; package thermal enhancement; popcorning elimination; reliability characterization; ruggedized plastic packages; Electromagnetic compatibility; Electronic components; Heat sinks; Lead; Materials testing; Mechanical factors; Microassembly; Plastic packaging; Resins; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-3286-5
Type :
conf
DOI :
10.1109/ECTC.1996.550893
Filename :
550893
Link To Document :
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