Title :
The NIST Center for Nanoscale Science and Technology: Supporting US Innovation in Nanotechnology
Author :
Celotta, Robert J.
Author_Institution :
Center for Nanoscale Sci. & Technol., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
June 28 2010-July 1 2010
Abstract :
The NIST Center for Nanoscale Science and Technology (CNST) was established in May of 2007 to accelerate innovation in nanotechnology-based commerce. Located in NIST´s Advanced Measurement Laboratory Complex on the Gaithersburg, MD campus, the CNST is the only national nanocenter with a focus on commerce. It supports the development of nanotechnology through research on measurement and fabrication methods and technology. The CNST has a unique design which supports the U.S. nanotechnology enterprise through the readily available, shared use NanoFab, as well as providing opportunities for collaboration in multidisciplinary research on new nanoscale measurement instruments and methods. The NanoFab is accessible to industry, academia, NIST, and other government agencies on a cost-reimbursable basis. With a simple application process, the NanoFab provides rapid access to a comprehensive suite of tools and processes for nanofabrication and measurement. While the NanoFab provides a comprehensive suite of commercial tools, the CNST´s research scientists and engineers are creating the next generation of nanoscale measurement instruments and fabrication methods, which are made available through collaboration.
Keywords :
commerce; innovation management; instruments; nanofabrication; Gaithersburg; NIST Advanced Measurement Laboratory Complex; NIST Center for Nanoscale Science and Technology; NanoFab; US innovation; US nanotechnology enterprise; nanoscale measurement instruments; nanotechnology-based commerce; Acceleration; Business; Collaboration; Fabrication; Government; Instruments; Laboratories; NIST; Nanotechnology; Technological innovation;
Conference_Titel :
Micro/Nano Symposium (UGIM), 2010 18th Biennial University/Government/Industry
Conference_Location :
West Lafayette, IN
Print_ISBN :
978-1-4244-4731-2
Electronic_ISBN :
0749-6877
DOI :
10.1109/UGIM.2010.5508946