• DocumentCode
    3008278
  • Title

    Synchronous performance and reliability improvement in pipelined ASICs

  • Author

    Soyata, Tolga ; Friedman, Eby G.

  • Author_Institution
    Dept. of Electr. Eng., Rochester Univ., NY, USA
  • fYear
    1994
  • fDate
    19-23 Sep 1994
  • Firstpage
    383
  • Lastpage
    390
  • Abstract
    The clock frequency of a synchronous circuit can be increased at the expense of increased system latency, area, and power using synchronous optimization techniques such as pipelining and retiming. Pipelining is well developed methodology, having been applied to almost every computer architecture from microprocessors to supercomputers. Retiming, on the other hand, has only recently become popular and practical application areas currently being developed. Both pipelining and retiming are reviewed in this paper. In order to make retiming more generally useful, low-level circuit delay components inherent to IC must be incorporated into the retiming process. These include variable register delay, clock skew, and interconnect delay. An algorithm is presented by the authors for incorporating variable register delays, interconnect delay, and the clock skew into retiming. The algorithm identifies and eliminates path-dependant race conditions in synchronous circuits. The results of applying the algorithm to MCNC benchmarks is presented and both performance and reliability improvements are observed
  • Keywords
    application specific integrated circuits; circuit optimisation; clocks; delays; hazards and race conditions; integrated circuit reliability; sequential circuits; timing; MCNC benchmarks; clock frequency; clock skew; interconnect delay; low-level circuit delay components; path-dependent race conditions; pipelined ASICs; reliability improvement; retiming; synchronous circuit; synchronous optimization techniques; system latency; variable register delay; Clocks; Computer architecture; Delay; Frequency; Integrated circuit interconnections; Microprocessors; Pipeline processing; Power system reliability; Registers; Supercomputers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1994. Proceedings., Seventh Annual IEEE International
  • Conference_Location
    Rochester, NY
  • Print_ISBN
    0-7803-2020-4
  • Type

    conf

  • DOI
    10.1109/ASIC.1994.404536
  • Filename
    404536