DocumentCode
3008449
Title
Linewidth Enhancement Factor of Semiconductor Lasers: Results from Round-Robin Measurements in COST 288
Author
Villafranca, Asier ; Lasobras, Javier ; Garces, Ignacio ; Giuliani, Guido ; Donati, Silvano ; Chacinski, Marek ; Schatz, Richard ; Kouloumentas, Christos ; Klonidis, Dimitrios ; Tomkos, Ioannis ; Landais, Pascal ; Escorihuela, Raul ; Rorison, Judy ; Pozo,
Author_Institution
Univ. of Zaragoza, Cuarte
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
Round-robin measurements on the linewidth enhancement factor are carried out within several laboratories participating to EU COST 288 action. The alpha-factor is measured by applying up to 7 different techniques. The obtained results are compared.
Keywords
semiconductor lasers; COST 288; linewidth enhancement factor; round-robin measurements; semiconductor lasers; Chirp modulation; Costs; Frequency modulation; Laboratories; Laser feedback; Optical feedback; Optical interferometry; Optical modulation; Photonics; Semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/CLEO.2007.4452795
Filename
4452795
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