DocumentCode :
300883
Title :
Robust stability of sampled-data systems under possibly unstable additive/multiplicative perturbations
Author :
Hagiwara, Tomomichi ; Araki, Mituhiko
Author_Institution :
Dept. of Electr. Eng., Kyoto Univ., Japan
Volume :
5
fYear :
1995
fDate :
21-23 Jun 1995
Firstpage :
3893
Abstract :
This paper applies the frequency response (FR) operator technique to the robust stability problem of sampled-data systems against additive/multiplicative perturbations, where a reasonable class of perturbations consists of unstable as well as stable ones. Under certain mild assumptions, we show that a small-gain condition in terms of the FR-operator representation (which is actually equivalent to a small-gain condition in terms of the L2-induced norm) is still necessary and sufficient for the sampled-data system to be robustly internally stable in the sense of exponential stability, in spite of possible instability of perturbations. The result is derived by a Nyquist-stability-criterion type of arguments. For the case where a stronger assumption is made that the perturbations are linear time-invariant, a necessary and sufficient condition for robust stability is given. Furthermore, we show that if the plant is either single-input or single-output, the condition can be reduced to a readily testable form. Finally, we clarify when the small-gain condition becomes a particularly poor measure for robust stability
Keywords :
Nyquist criterion; frequency response; robust control; sampled data systems; L2-induced norm; Nyquist stability criterion; exponential stability; frequency-response operator; linear time-invariant perturbations; necessary and sufficient condition; robust internal stability; sampled-data systems; small-gain condition; unstable additive/multiplicative perturbations; Control system analysis; Control systems; Frequency domain analysis; Gain measurement; Particle measurements; Robust stability; Robustness; Sufficient conditions; Testing; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, Proceedings of the 1995
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2445-5
Type :
conf
DOI :
10.1109/ACC.1995.533871
Filename :
533871
Link To Document :
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