DocumentCode :
3008893
Title :
Automated test system for parametric control of voltage supervisors
Author :
Aristova, N.E. ; Tararaksin, A.S. ; Kessarinskiy, L.N. ; Borisov, A.Y. ; Nikiforov, A.Y.
Author_Institution :
Nat. Res. Nucl. Univ. (Moscow Eng. Phys. Inst.), Moscow, Russia
fYear :
2015
fDate :
21-23 May 2015
Firstpage :
1
Lastpage :
4
Abstract :
This article describes the automated test facility system for parametric control of voltage supervisors before, during and after irradiation in radiation tests based on the National instruments PXI family equipment.
Keywords :
automatic testing; radiation hardening (electronics); reference circuits; National instruments PXI family equipment; automated test system; irradiation; parametric control; radiation tests; voltage supervisors; Control systems; Current measurement; Nickel; Radiation effects; Testing; Voltage control; Voltage measurement; PXI; parametric control; radiation tests; voltage supervisor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Communications (SIBCON), 2015 International Siberian Conference on
Conference_Location :
Omsk
Print_ISBN :
978-1-4799-7102-2
Type :
conf
DOI :
10.1109/SIBCON.2015.7146985
Filename :
7146985
Link To Document :
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