DocumentCode :
3008951
Title :
Compactness measure of digital shapes
Author :
Lee, Samuel C. ; Wang, Yiming ; Lee, Elisa T.
Author_Institution :
Sch. of Electr. & Comput. Eng., Oklahoma Univ., Norman, OK, USA
fYear :
2004
fDate :
38079
Firstpage :
103
Lastpage :
105
Abstract :
This paper presents a method for measuring the compactness of digital shapes, namely, the digital compactness. Unlike analog shapes, boundary of a digital shape (especially for low-resolution image) has measurable width and thus both its perimeter and area may have different measurements using different methods. Furthermore, rotating a digital shape results in changes in its perimeter and area, and thus its digital compactness. The purpose of this paper is to search for a method for measuring the perimeter, area, and compactness of a digital shape so that, for a given analog geometric shape, the difference between its analog compactness and digital compactness is minimized.
Keywords :
edge detection; image segmentation; matrix algebra; shape measurement; boundary pixels; boundary-following algorithm; compactness measurement; digital compactness; digital shapes; low-resolution image; region-based shape descriptors; shape boundary; Area measurement; Cities and towns; Electric variables measurement; Euclidean distance; Joining processes; Length measurement; Niobium; Shape measurement; Solids; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Region 5 Conference: Annual Technical and Leadership Workshop, 2004
Print_ISBN :
0-7803-8217-X
Type :
conf
DOI :
10.1109/REG5.2004.1300173
Filename :
1300173
Link To Document :
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