DocumentCode :
3009026
Title :
Study on Structures and Electrical Properties of 4H-SiC Floating-Junction SBDs
Author :
Nan, Yagong ; Xiang, Genxiang ; Li, Shouyi
Author_Institution :
Dept. of Phys. & Electron., Hexi Univ., Zhangye, China
fYear :
2010
fDate :
25-27 June 2010
Firstpage :
4317
Lastpage :
4320
Abstract :
In this paper, with the purpose of improvement of power devices properties, the floating-junction technology was used in the 4H-SiC Schottky barrier diodes (SBD) and some parameters were optimized by software simulation. And compared with the conventional power SBDs, the electrical properties of floating-junction Schottky barrier diodes, especially the reverse blocking properties were enhanced. The breakdown voltage and specific on-resistance could reach 4.5KV and 6.15 mΩ.cm2 respectively, while in company with the increasing of Baliga figure of material (BFOM). Then we also investigated the devices switching process and temperature characteristics under definite conditions.
Keywords :
Schottky barriers; Schottky diodes; semiconductor device breakdown; silicon compounds; wide band gap semiconductors; Baliga material figure; SiC; breakdown voltage; devices switching process; floating-junction Schottky barrier diodes; floating-junction technology; power devices properties; software simulation; voltage 4.5 kV; Electric fields; Junctions; Schottky barriers; Schottky diodes; Semiconductor process modeling; Silicon carbide; 4H-SiC; SBDs; floatin junction; structures and electrical properties;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
Type :
conf
DOI :
10.1109/iCECE.2010.1049
Filename :
5631361
Link To Document :
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